Analysis of Shielded Microstrip by Spectral Domain Immittance Approach

Li Chao; Zhou Bin; Li Fang; Yin He-jun

Volume 26 Issue 4

Apr. 2004

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Article Navigation > Journal of Electronics & Information Technology > 2004 > 26(4): 632-639

Li Chao, Zhou Bin, Li Fang, Yin He-jun. Analysis of Shielded Microstrip by Spectral Domain Immittance Approach[J]. Journal of Electronics & Information Technology, 2004, 26(4): 632-639.

Citation:

Li Chao, Zhou Bin, Li Fang, Yin He-jun. Analysis of Shielded Microstrip by Spectral Domain Immittance Approach[J]. Journal of Electronics & Information Technology, 2004, 26(4): 632-639.

Li Chao, Zhou Bin, Li Fang, Yin He-jun. Analysis of Shielded Microstrip by Spectral Domain Immittance Approach[J]. Journal of Electronics & Information Technology, 2004, 26(4): 632-639.

Citation:

Li Chao, Zhou Bin, Li Fang, Yin He-jun. Analysis of Shielded Microstrip by Spectral Domain Immittance Approach[J]. Journal of Electronics & Information Technology, 2004, 26(4): 632-639.

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Analysis of Shielded Microstrip by Spectral Domain Immittance Approach

Received Date: 2002-09-03
Rev Recd Date: 2002-12-23
Publish Date: 2004-04-19

Abstract

Abstract

Influence of the shielding box 011 the propagation and dispersion characteristics of microstrip has been analyzed by the spectral domain immittance approach. This greatly simplified the formulation process in traditional spectral domain method and the results remain a high level of accuracy. Numerical results show that top metal cover decreases the effective dielectric constant of microstrip, however, it does not have noticeable effects 011 the dispersion characteristics of microstrip. The results also show that metal sidewalls increase the effective dielectric constant of microstrip and lower the dispersion of microstrip.

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References(1)

References

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