THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF LINEAR CIRCUIT

Wu Yao; Tong Shihai

Volume 11 Issue 2

Mar. 1989

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Article Navigation > Journal of Electronics & Information Technology > 1989 > 11(2): 113-120

Wu Yao, Tong Shihai. THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF LINEAR CIRCUIT[J]. Journal of Electronics & Information Technology, 1989, 11(2): 113-120.

Citation:

Wu Yao, Tong Shihai. THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF LINEAR CIRCUIT[J]. Journal of Electronics & Information Technology, 1989, 11(2): 113-120.

Wu Yao, Tong Shihai. THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF LINEAR CIRCUIT[J]. Journal of Electronics & Information Technology, 1989, 11(2): 113-120.

Citation:

Wu Yao, Tong Shihai. THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF LINEAR CIRCUIT[J]. Journal of Electronics & Information Technology, 1989, 11(2): 113-120.

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THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF LINEAR CIRCUIT

Wu Yao,
Tong Shihai

Received Date: 1987-12-14
Rev Recd Date: 1988-04-22
Publish Date: 1989-03-19

Abstract

Abstract

In view of K-fault testability, the topological construction of a practical circuif is far from ideal. In order to improve the testability of a circuit, it is used to increase the number of accessible nodes or to use multi-excitation method. Effectiveness of these methods and feasibility choosing accessible nodes arc discussed in detail. The conditions for multi-excitation testability are presented.

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References(1)

References

Zheng F. Huang, Cheng-Shang Lin, Ruey-Wen Liu, IEEE Trans. on CAS, CAS-30(1983), 257-265.[2]邹锐,模拟电路K故障诊断,华中工学院学报,1985年,第2期,第1-8页.[3]蒋本璐,范丽娟,具有不可及节点的模拟电路的多故障诊断,1984年中国电子学会电路与系统第五届年会论文集,西安,1985,第299-303页.

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