DECISION OF OPTIMAL HOPFIELD NEURAL NETWORKS OF COMBINATIONAL CIRCUITS

Zhang Jianzhou; Chen Chaoyang; Yu Juebang; Chen Guangju

Volume 18 Issue 2

Mar. 1996

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Article Navigation > Journal of Electronics & Information Technology > 1996 > 18(2): 209-212

Zhang Jianzhou, Chen Chaoyang, Yu Juebang, Chen Guangju. DECISION OF OPTIMAL HOPFIELD NEURAL NETWORKS OF COMBINATIONAL CIRCUITS[J]. Journal of Electronics & Information Technology, 1996, 18(2): 209-212.

Citation:

Zhang Jianzhou, Chen Chaoyang, Yu Juebang, Chen Guangju. DECISION OF OPTIMAL HOPFIELD NEURAL NETWORKS OF COMBINATIONAL CIRCUITS[J]. Journal of Electronics & Information Technology, 1996, 18(2): 209-212.

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DECISION OF OPTIMAL HOPFIELD NEURAL NETWORKS OF COMBINATIONAL CIRCUITS

Received Date: 1994-08-29
Rev Recd Date: 1995-01-16
Publish Date: 1996-03-19

Abstract

Abstract

By use of Hopfield model and basis solution of homogeneous linear equations which are established in accordance with consistent state, a practical decision method for the existence of optimal Hopfield model of combinational circuits is provided. Finally, several examples are given.

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References(1)

References

Chakradhar S T, Bushnell M L, Agrawal V D. Automatic Test Generation Using Neural Networks. IEEE Int. Conf. on CAD, Santa Clara: 1988, 416-419.[2]Chakradhar S T, Bushnell M L, Agrawal V D. IEEE Trans. on CAD, 1990, CAD-9(9): 981-994.[3]Chakradhar S T, Agrawal V D, Bushnell M L. Polynomial Time Solvalle Fault Detection Problems. IEEE Int. Symp. on Fault-Tolerant Computing, Newcastle upon Tyne: 1990, 56-63.[4]Fujiwara H. Three Valued Neural Networks for Test Generation. IEEE Int. Symp. on Fault-Tolerant Computing, Newcastle upon Tyne: 1990, 64-71.[5]张中,魏道政.电子学报,1993, 21(8): 77-81.

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