Zhi Tian, Yang Hai-Gang, Cai Gang, Qiu Xiao-Qiang, Li Tian-Wen, Wang Xin-Gang. Study on the Prediction of Single-event Effects Induced Failure Rate for Embedded Memories[J]. Journal of Electronics & Information Technology, 2014, 36(12): 3035-3041. doi: 10.3724/SP.J.1146.2013.02025
Citation:
Ruan Xiu-Kai, Jiang Xiao, Li Chang. A Novel Method of Bussgang-type Blind Equalization in High-order QAM Systems[J]. Journal of Electronics & Information Technology, 2012, 34(8): 2018-2022. doi: 10.3724/SP.J.1146.2011.01403
Zhi Tian, Yang Hai-Gang, Cai Gang, Qiu Xiao-Qiang, Li Tian-Wen, Wang Xin-Gang. Study on the Prediction of Single-event Effects Induced Failure Rate for Embedded Memories[J]. Journal of Electronics & Information Technology, 2014, 36(12): 3035-3041. doi: 10.3724/SP.J.1146.2013.02025
Citation:
Ruan Xiu-Kai, Jiang Xiao, Li Chang. A Novel Method of Bussgang-type Blind Equalization in High-order QAM Systems[J]. Journal of Electronics & Information Technology, 2012, 34(8): 2018-2022. doi: 10.3724/SP.J.1146.2011.01403
A novel multi-modulus method of Bussgang-type blind equalization algorithm in higher-order Quadrature Amplitude Modulation (QAM) systems is proposed. To reduce the steady-state error effectively, an instantaneous switch-mode hybrid algorithm whose associative cost function is formulated by the novel cost function and the Constellation Matched Error (CME) is proposed, and a criterion of circular mode switching decision is designed. Finally, 256-QAM signal is used to simulate, all of these results verify the proposed blind equalization algorithm can achieve good performance in high-order QAM systems.
Zhi Tian, Yang Hai-Gang, Cai Gang, Qiu Xiao-Qiang, Li Tian-Wen, Wang Xin-Gang. Study on the Prediction of Single-event Effects Induced Failure Rate for Embedded Memories[J]. Journal of Electronics & Information Technology, 2014, 36(12): 3035-3041. doi: 10.3724/SP.J.1146.2013.02025
Zhi Tian, Yang Hai-Gang, Cai Gang, Qiu Xiao-Qiang, Li Tian-Wen, Wang Xin-Gang. Study on the Prediction of Single-event Effects Induced Failure Rate for Embedded Memories[J]. Journal of Electronics & Information Technology, 2014, 36(12): 3035-3041. doi: 10.3724/SP.J.1146.2013.02025