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Volume 34 Issue 8
Sep.  2012
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Article Contents
Zhi Tian, Yang Hai-Gang, Cai Gang, Qiu Xiao-Qiang, Li Tian-Wen, Wang Xin-Gang. Study on the Prediction of Single-event Effects Induced Failure Rate for Embedded Memories[J]. Journal of Electronics & Information Technology, 2014, 36(12): 3035-3041. doi: 10.3724/SP.J.1146.2013.02025
Citation: Duan Jia, Zhang Lei, Sheng Jia-Lian, Xing Meng-Dao. Parameters Decouple and Estimation of Independent Attributed Scattering Centers[J]. Journal of Electronics & Information Technology, 2012, 34(8): 1853-1859. doi: 10.3724/SP.J.1146.2011.01302

Parameters Decouple and Estimation of Independent Attributed Scattering Centers

doi: 10.3724/SP.J.1146.2011.01302
  • Received Date: 2011-12-09
  • Rev Recd Date: 2012-04-13
  • Publish Date: 2012-08-19
  • Modified and developed from the original Geometrical Theory of Diffraction (GTD) model, attributed scattering center model takes the advantages of both frequency and angle dependent properties for the model parameters, providing much richer information of the target. However, it also brings such problem as parameter dimension increasing. Research on the independent scattering centers a novel algorithm of parameter estimation is proposed, where the linking parameter dimension could be reduced effectively and the parameters could be estimated in precision. In the scheme, the object function is constructed to seek parameters and they can be estimated by solving the optimization. In this method, precision initial values of the parameters are not required. Thus the computational complexity is reduced. Numeric simulation results confirm the validation of the proposed algorithm.
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