Coarse-to-fine Inspection for Flexo First Item Based on the Electronic Sample

XIAO Pan; YAN Shule; LONG Jinliang; XIAO Meng; CAI Nian; CHEN Xindu

doi:10.11999/JEIT211358

Volume 44 Issue 5

May 2022

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Article Navigation > Journal of Electronics & Information Technology > 2022 > 44(5): 1563-1571

XIAO Pan, YAN Shule, LONG Jinliang, XIAO Meng, CAI Nian, CHEN Xindu. Coarse-to-fine Inspection for Flexo First Item Based on the Electronic Sample[J]. Journal of Electronics & Information Technology, 2022, 44(5): 1563-1571. doi: 10.11999/JEIT211358

Citation:

XIAO Pan, YAN Shule, LONG Jinliang, XIAO Meng, CAI Nian, CHEN Xindu. Coarse-to-fine Inspection for Flexo First Item Based on the Electronic Sample[J]. Journal of Electronics & Information Technology, 2022, 44(5): 1563-1571. doi: 10.11999/JEIT211358

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Coarse-to-fine Inspection for Flexo First Item Based on the Electronic Sample

doi: 10.11999/JEIT211358

XIAO Pan¹,
YAN Shule^{1, 2},
LONG Jinliang^{1, 2},
XIAO Meng^{1, 2},
CAI Nian^{1, 2
,
,},
CHEN Xindu¹

1.
State Key Laboratory of Precision Electronic Manufacturing Technology and Equipment, Guangdong University of Technology, Guangzhou 510006, China
2.
School of Information Engineering, Guangdong University of Technology, Guangzhou 510006, China

Funds: State Key Laboratory Open Fund Project(2019DG780017), The National Natural Science Foundation of China (62171142), The Natural Science Foundation of Guangdong Province (2021A1515011908), The Research Fund for Colleges and Universities in Huizhou(2019HZKY003)

Received Date: 2021-11-29
Rev Recd Date: 2022-03-30

Available Online: 2022-04-12

Publish Date: 2022-05-25

Abstract

Abstract

In order to solve the problem that there is no real reference of the fabric image in the flexo first item inspection, a coarse-to-fine inspection method of flexo first item is proposed based on electronic samples, which is mainly divided into three stages: coarse matching, fine matching and defect detection. First, since different thickness of the characters, large differences in gray characteristics, and high repetition of flexo content inherently exist in the electronic sample and the flexo first item, the SuperGlue with SuperPoint are employed for rough matching. Then, a Normalized Cross-Correlation(NCC)-based method is used to fine-tune the electronic sample characters for fine matching, which can deal with local offsets of flexo content are caused by plate expansion and bending in flexo printing process. Finally, a constrained clustering method is proposed to transform the defect detection problem into the problem of minimizing the difference between electronic sample and flexo first item. Comparison experiments show that the proposed method can achieve better inspection performance for flexo first item, with the missed detection rate of 0, the false detection rate of 1.3%, the average Dice coefficient of 0.941, and the inspection time of 2.761 s/pcs. This promising inspection indicates that the proposed method can be well employed in real industries.
- Printing defect detection,
- Flexo first item inspection,
- Electronic sample,
- SuperGlue,
- Constrained clustering

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References(22)

References

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