A Method for Evaluating the Severity of Intermittent Faults of Electronic Systems Based on Variational Mode Decomposition-Gated Recurrent Units

LI Sheng; XU Feiyang; LI Yuxiao; LIU Songhua; ZHANG Wensheng; GUO Zhaolu

doi:10.11999/JEIT210795

Volume 44 Issue 10

Oct. 2022

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Article Navigation > Journal of Electronics & Information Technology > 2022 > 44(10): 3673-3682

LI Sheng, XU Feiyang, LI Yuxiao, LIU Songhua, ZHANG Wensheng, GUO Zhaolu. A Method for Evaluating the Severity of Intermittent Faults of Electronic Systems Based on Variational Mode Decomposition-Gated Recurrent Units[J]. Journal of Electronics & Information Technology, 2022, 44(10): 3673-3682. doi: 10.11999/JEIT210795

Citation:

LI Sheng, XU Feiyang, LI Yuxiao, LIU Songhua, ZHANG Wensheng, GUO Zhaolu. A Method for Evaluating the Severity of Intermittent Faults of Electronic Systems Based on Variational Mode Decomposition-Gated Recurrent Units[J]. Journal of Electronics & Information Technology, 2022, 44(10): 3673-3682. doi: 10.11999/JEIT210795

Citation:

LI Sheng, XU Feiyang, LI Yuxiao, LIU Songhua, ZHANG Wensheng, GUO Zhaolu. A Method for Evaluating the Severity of Intermittent Faults of Electronic Systems Based on Variational Mode Decomposition-Gated Recurrent Units[J]. Journal of Electronics & Information Technology, 2022, 44(10): 3673-3682. doi: 10.11999/JEIT210795

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A Method for Evaluating the Severity of Intermittent Faults of Electronic Systems Based on Variational Mode Decomposition-Gated Recurrent Units

doi: 10.11999/JEIT210795

1.
School of Science, Jiangxi University of Science and Technology, Ganzhou 341000, China
2.
School of Information and Computer, Taiyuan University of Technology, Jinzhong 030600, China
3.
Institute of Automation, Chinese Academy of Sciences, Beijing 100190, China

Funds: The National Natural Science Foundation of China (61762047, 61662029, U1636220)

Received Date: 2021-08-09
Rev Recd Date: 2021-09-28

Available Online: 2021-10-01

Publish Date: 2022-10-19

Abstract

Abstract

Considering the problem that the intermittent fault signal of the electronic system is greatly affected by noise and has a lot of redundant information, which results in the limitation of the deep neural network model to evaluate the severity of the intermittent fault. A method for evaluating the severity of intermittent faults based on Variational Mode Decomposition-Gated Recurrent Units (VMD-GRU) is proposed. Firstly, all Intrinsic Mode Function (IMF) components are adaptively decomposed on intermittent fault signals through Variational Mode Decomposition (VMD). Then the sensitivity analysis of the IMF components is performed to select the sensitive components, and the differential enhanced energy operator is used to construct the severity sensitivity factor. Finally, the severity sensitivity factor is used to train the Gated Recurrent Units (GRU) recurrent neural network severity evaluation model. Through the evaluation of intermittent faults of different severity injected into the key circuits of electronic systems, the results show that this method has a strong ability to evaluate the severity of intermittent faults, and is more accurate and effective in evaluating the severity of intermittent faults.
- Intermittent fault,
- Severity sensitivity factor,
- Variational Mode Decomposition-Gated Recurrent Units (VMD-GRU),
- Fault injection,
- Electronic system

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References(27)

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