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Volume 39 Issue 6
Jun.  2017
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YE Yong, KANG Yong, SONG Zhitang, CHEN Bangming. Design of High-density Mask ROM Based on Diode Cells[J]. Journal of Electronics & Information Technology, 2017, 39(6): 1452-1457. doi: 10.11999/JEIT160938
Citation: YE Yong, KANG Yong, SONG Zhitang, CHEN Bangming. Design of High-density Mask ROM Based on Diode Cells[J]. Journal of Electronics & Information Technology, 2017, 39(6): 1452-1457. doi: 10.11999/JEIT160938

Design of High-density Mask ROM Based on Diode Cells

doi: 10.11999/JEIT160938
Funds:

Strategic Priority Research Program of the Chinese Academy of Sciences (XDA09020402), The National Key Basic Research Program of China (2013CBA01904, 2013CBA01900, 2010CB934300, 2011CBA00607, 2011CB932804), The National Integrate Circuit Research Program of China (2009ZX02023-003), The National Natural Science Foundation of China (61076121, 61176122, 61106001, 61261160500, 61376006)

  • Received Date: 2016-09-19
  • Rev Recd Date: 2017-01-22
  • Publish Date: 2017-06-19
  • Since the traditional Read-Only Memory (ROM) has the problems of low density and high power consumption, a mask ROM based on diode cells and contact-programming process is proposed. With dual-trench isolation process and borderless contact scheme, the diode array can realize ultrahigh density. Based on the proposed novel diode array, a mask ROM macro with 2 Mb capacity is designed, which contains 8 256 kb sub-arrays. The diode arrays are fabricated with 40 nm design rule and the peripheral logic circuits are achieved in 2.5 V CMOS process. The effective area of the diode cell is only 0.017 m2 and the density of the diode array is 0.0268 mm2/Mb. Test results show that the cell feature of diodes is good and the bit yield of the 2 Mb ROM achieves 99.8% under 2.5 V supply voltage.
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  • LU S K, TSAI C J, and HASHIZUME M. Enhanced built-in self-repair techniques for improving fabrication yield and reliability of embedded memories[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2016, 24(8): 2726-2734. doi: 10.1109/TVLSI.2016.2523499.
    MOHAMMAD B S, SALEH H, and ISMAI M. Design methodologies for yield enhancement and power efficiency in SRAM-based SoCs[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2015, 23(10): 2054-2064. doi: 10.1109/TVLSI.2014.2360319.
    CHEN Y J, HUANG C E, CHEN H M, et al. A novel 2-bit/cell p-channel logic programmable cell with pure 90-nm CMOS technology[J]. IEEE Electron Device Letters, 2008, 29(8): 938-940. doi: 10.1109/LED.2008.2000969.
    顾明, 杨军. 基于物理指数MOSFET模型的SRAM存储体单元优化[J]. 电子与信息学报, 2007, 29(1): 223-226.
    GU M and YANG J. Optimization of SRAM memory cell based on physical alpha-power law MOSEFT model[J]. Journal of Electronics Information Technology, 2007, 29(1): 223-226.
    KHANDELWAL S, RAJ B, and GUPTA R D. FinFET based 6T SRAM cell design: analysis of performance metric, process variation and temperature effect[J]. Journal of Computational and Theoretical Nanoscience, 2015, 12(9): 2500-2506. doi: 10.1166/jctn.2015.4055.
    WANG J, WANG L, YIN H, et al. cNV SRAM: CMOS technology compatible non-volatile SRAM based ultra-low leakage energy hybrid memory system[J]. IEEE Transactions on Computers, 2016, 65(4): 1055-1067. doi: 10.1109/TC. 2014.2375187.
    NARUSE M, KAMEI T, KUNIO T, et al. A 65 nm single- chip application and dual-mode baseband processor with partial clock activation and IP-MMU[J]. IEEE Journal of Solid-State Circuits, 2009, 44(1): 83-89. doi: 10.1109/JSSC. 2008.2007169.
    KULKARNI S H, CHEN Z, HE J, et al. A 4 kb metal-fuse OTP-ROM macro featuring a 2V programmable 1.37 m2 1T1R bit cell in 32 nm high-k metal-gate CMOS[J]. IEEE Journal of Solid-State Circuits, 2010, 45(4): 863-868. doi: 10.1109/JSSC.2010.2040115.
    LIU Z, ZHENG R, and SUN J. A gate-oxide-breakdown antifuse OTP ROM array based on TSMC 90 nm process[C]. 2015 International Symposium on Next-Generation Electronics (ISNE), Taipei, China, 2015: 1-3. doi: 10.1109/ ISNE.2015.7132015.
    KULKARNI S H, CHEN Z, SRINIVASAN B, et al. A high- density metal-fuse technology featuring a 1.6 V programmable low-voltage bit cell with integrated 1 V charge pumps in 22 nm tri-gate CMOS[J]. IEEE Journal of Solid-State Circuits, 2016, 51(4): 1003-1008. doi: 10.1109/ JSSC.2015.2507786.
    CHANG M F and YANG S M. Analysis and reduction of supply noise uctuations induced by embedded via- programming ROM[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2009, 17(6): 758-769. doi: 10.1109/TVLSI.2008.2006794.
    JANG B J, LEE C H, SIM S H, et al. Robust via- programmable ROM design based on 45 nm process considering process variation and enhancement Vmin and yield[C]. IEEE International Symposium on Circuits and Systems (ISCAS), Piscataway, USA, 2015: 2541-2544. doi: 10.1109/ISCAS.2015.7169203.
    UMEMOTO Y, NII Y, ISHIKAWA J, et al. 28 nm 50% power-reducing contacted mask read only memory macro with 0.72 ns read access time using 2T pair bitcell and dynamic column source bias control technique[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22(3): 575-584. doi: 10.1109/TVLSI.2013.2246201.
    HUANG C E, CHEN Y J, LAI H C, et al. A study of self- aligned nitride erasable OTP cell by 45-nm CMOS fully compatible process[J]. IEEE Transactions on Electron Device, 2009, 56(6): 1228-1234. doi: 10.1109/TED.2009.2018169.
    YANG S M, CHANG M F, CHIANG C C, et al. Low-voltage embedded NAND-ROM macros using data-aware sensing reference scheme for VDDmin, speed and power improvement [J]. IEEE Journal of Solid-State Circuits, 2013, 48(2): 611-623. doi: 10.1109/JSSC.2012.2229068.
    CHANG M F, YANG S M, LIANG C W, et al. Noise-immune embedded NAND ROM using a dynamic split source-line scheme for VDDmin and speed improvements[J]. IEEE Journal of Solid-State Circuits, 2010, 45(10): 2142-2155. doi: 10.1109/JSSC.2010.2060279.
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