Propagation Mechanism of Single Event Transient and Soft Error Rate Analysis Method Based on Four-value Pulse Parameters Model

LI Yue; CAI Gang; LI Tianwen; YANG Haigang

doi:10.11999/JEIT151254

Volume 38 Issue 8

Sep. 2016

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Article Navigation > Journal of Electronics & Information Technology > 2016 > 38(8): 2113-2121

LI Yue, CAI Gang, LI Tianwen, YANG Haigang. Propagation Mechanism of Single Event Transient and Soft Error Rate Analysis Method Based on Four-value Pulse Parameters Model[J]. Journal of Electronics & Information Technology, 2016, 38(8): 2113-2121. doi: 10.11999/JEIT151254

Citation:

LI Yue, CAI Gang, LI Tianwen, YANG Haigang. Propagation Mechanism of Single Event Transient and Soft Error Rate Analysis Method Based on Four-value Pulse Parameters Model[J]. Journal of Electronics & Information Technology, 2016, 38(8): 2113-2121. doi: 10.11999/JEIT151254

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Propagation Mechanism of Single Event Transient and Soft Error Rate Analysis Method Based on Four-value Pulse Parameters Model

doi: 10.11999/JEIT151254

1.
2.
(Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China)

Funds:

The National Natural Science Foundation of China (61271149), The National Science and Technology Major Special Fund (2013ZX03006004)

Received Date: 2015-11-09
Rev Recd Date: 2016-04-01
Publish Date: 2016-08-19

Abstract

Abstract

With the shrinking of feature size, soft errors due to Single Event Transient (SET) effect become the main reliability threat for aerospace deep sub-micron VLSI circuits, and the generation and propagation of SET pulse is also a hot issue in the study of soft error. Results of SET pulse propagation on logic chains show that the difference of rise and fall time of SET pulse can make the width of output pulse widened or lessened. The width and amplitude of SET pulse can determine whether it is electrically masked out. A four-value pulse parameters model is proposed to accurately characterize the shape of SET pulse, and then the LUT-based technique is combined with experiential equations to model the transmission process of SET. The proposed four-value pulse parameters model can model the effect of broadening or attenuation of SET pulse, and it has calculation precision improvement of 2.4% compared with single parameter model. This paper applies the graph-based error propagation probability analytic algorithm to estimate the logical masking in pulse propagation. The experimental results on ISCAS89 and ISCAS85 circuits show that the average deviation of this method and HSPICE simulation method is 4.12% and the calculation speed is 10000 times. This method can be used to analyze quickly the soft error rate of large scale integrated circuits.
- Very Large Scale Integration (VLSI),
- Soft error rate,
- Single Event Transient (SET),
- Four-value pulse parameters,
- Error propagation probability

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References(27)

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