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Volume 38 Issue 6
Jun.  2016
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LI Gang, WANG Pengjun, ZHANG Yuejun, QIAN Haoyu. Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology[J]. Journal of Electronics & Information Technology, 2016, 38(6): 1541-1546. doi: 10.11999/JEIT150968
Citation: LI Gang, WANG Pengjun, ZHANG Yuejun, QIAN Haoyu. Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology[J]. Journal of Electronics & Information Technology, 2016, 38(6): 1541-1546. doi: 10.11999/JEIT150968

Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology

doi: 10.11999/JEIT150968
Funds:

The National Natural Science Foundation of China (61474068, 61274132), The Natural Science Foundation of Zhejiang Provice (LQ14F040001), The Project of Department of Education of Zhejiang Provice (Y201430798)

  • Received Date: 2015-08-24
  • Rev Recd Date: 2016-01-20
  • Publish Date: 2016-06-19
  • Physical Unclonable Functions (PUF) exploits process variation across the same structure circuits during the manufacturing processes to generate numerous unique, random and unclonable security keys. In this paper, a multi-port configurable PUF scheme is proposed, which is based on random deviation of current mirrors. It consists of input register, deviation-voltage source, multiplexing-net, arbiter array and obfuscation circuit. After configuring deviation-voltage source by applying different input challenges, the PUF circuit updates keys without physically replacement, and it can generate multi-bit keys in a clock cycle. In SMIC 65 nm CMOS technology, the layout of 36 ports configurable PUF occupies 24.8 m77.4 m with custom designing. Experimental results show that the PUF circuit possesses better statistical characteristic of uniqueness and randomness, and it has a high reliability of 97.4% with respect to temperature variation from ?40 C to 125 C, and supply voltage variation from 1.08 V to 1.32 V. It can be effectively used in information security field.
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