Advanced Search
Volume 37 Issue 10
Sep.  2015
Turn off MathJax
Article Contents
Kuang Ji-shun, Zhou Ying-bo, Cai Shuo. Adaptive EFDR Coding Method for Test Data Compression[J]. Journal of Electronics & Information Technology, 2015, 37(10): 2529-2535. doi: 10.11999/JEIT150177
Citation: Kuang Ji-shun, Zhou Ying-bo, Cai Shuo. Adaptive EFDR Coding Method for Test Data Compression[J]. Journal of Electronics & Information Technology, 2015, 37(10): 2529-2535. doi: 10.11999/JEIT150177

Adaptive EFDR Coding Method for Test Data Compression

doi: 10.11999/JEIT150177
Funds:

The National Natural Science Foundation of China (61472123, 60673085)

  • Received Date: 2015-02-02
  • Rev Recd Date: 2015-05-21
  • Publish Date: 2015-10-19
  • An adaptive Extended Frequency-Directed Run-length (EFDR) code method for test data compression is presented in this paper. The method is based on EFDR code, and adds an additional parameter N, which is used to represent the code length difference between tail and prefix. According to the distribution of the runs in each test vector of the test set, the method selects the most suitable N values to code, and it can improve the compression ratio. For the decompression, according to the size of the codeword, the run length of the original test data can be obtained with a simple mathematical operation. Meanwhile, those codeword under different parameter values can be decoded by the same decompression circuit. Thus, the decompression circuit can keep in a low hardware cost level. The experimental result shows that the average compression rate of the proposed method can achieve to 69.87%, over 4.07% than original EFDR code method.
  • loading
  • Mehta U S, Dasgupta K S, and Evashrayee N J. Un-length-based test data compression techniques: how far from entropy and power bounds a survey[J]. VLSI Design, 2010(1): 1-9.
    刘铁桥, 邝继顺, 蔡烁. 一种将测试集嵌入到Test-per-Clock位流中的方法[J]. 计算机研究与发展, 2014, 51(9): 2022-2029.
    Liu Tie-qiao, Kuang Ji-shun, and Cai Shuo. A new method of embedding test patterns into test-per-clock bit stream[J]. Journal of Computer Research and Development, 2014, 51(9): 2022-2029.
    Anshuman C and Krishnendu C. Frequency-Directed Run- length(FDR) codes with application to system-on-a-chip test data compression[C]. Proceedings of the 19th IEEE VLSI Test Symposium, Atlantic, 2001: 42-47.
    EL-Maleh A H. Test data compression for system-on-a-chip using Extended Frequency-Directed Run-Length Code[J]. IET Computers Digital Techniques, 2008(2): 155-163.
    Dauh T W and Jen L L. Test data compression using multi-dimensional pattern run-length codes[J]. Journal Electron Test, 2010, 26(3): 393-400.
    Ye B, Zhao Q, Zhou D, et al.. Test data compression using alternating variable run-length code[J]. INTEGRATION, the VLSI Journal, 2011(44): 103-110.
    梁华国, 蒋翠云, 罗强. 应用对称编码的测试数据压缩方法[J]. 计算机研究与发展, 2011, 48(12): 2391-2399.
    Liang Hua-guo, Jiang Cui-yun, and Luo Qiang. Test data compression and decompression using symmetry-variable codes[J]. Journal of Computer Research and Development, 2011, 48(12): 2391-2399.
    马会, 邝继顺, 马伟. 基于一位标识的测试向量混合编码压缩方法[J]. 电子测量与仪器学报, 2013, 27(4): 312-318.
    Ma Hui, Kuang Ji-shun, and Ma Wei. Hybrid coding compression method of test vector based on an identification [J]. Journal of Electronic Measurement and Instrument, 2013, 27(4): 312-318.
    Gonciari P T, AI-Hashimi B M, and Nicolici N. Variable- length input Huffman coding for system-on-a-chip test[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2003, 22(6): 783-789.
    EL-Maleh A H. Efficient test compression technique based on block merging[J]. IET Computer Digital Techniques, 2008, 5(2): 327-335.
    Zhang L and Kuang J S. Test data compression using selective sparse storage[J]. Journal Electron Test, 2011, 27(4): 565-577.
    刘杰, 易茂祥, 朱勇. 采用字典词条衍生模式的测试数据压缩[J]. 电子与信息学报, 2012, 34(1): 231-235.
    Liu Jie, Yi Mao-xiang, and Zhu Yong. Test data compression using entry derivative mode of dictionary[J]. Journal of Electronics Information Technology, 2012, 34(1): 231-235.
    Sismanoglou P and Nikolos D. Test data compression based on reuse and bit-flipping of parts of dictionary entries[C]. Proceedings of 17th International Symposium on Design and Diagnostics of Electronic Circuits Systems, Warsaw, 2014: 110-115.
    Tyszer J, Filipek M, Mrugalski G, et al.. New test compression scheme based on low power BIST[C]. Processdings of 18th IEEE European Test Symposium, Avignon, 2013: 1-6.
    Chloupek M, Jenicek J, Novak O, et al.. Test pattern decompression in parallel scan chain architecture[C]. Proceedings of 16th International Symposium on Design and Diagnostics of Electronic Circuits Systems, Karlovy, 2013: 219-223.
    方昊, 姚博, 宋晓笛. 双游程编码的无关位填充算法[J]. 电子学报, 2009, 37(1): 1-7.
    Fang Hao, Yao Bo, and Song Xiao-di. The algorithm of filling X bits in dual-run-length coding[J]. Acta Electronica Sinica, 2009, 37(1): 1-7.
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Article Metrics

    Article views (1203) PDF downloads(449) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return