Test Data Compression Method for Multiple Scan Chain Based on Mirror-symmetrical Reference Slices

Kuang Ji-shun; Liu Jie-tang; Zhang Liang

doi:10.11999/JEIT141146

Volume 37 Issue 6

Jun. 2015

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Kuang Ji-shun, Liu Jie-tang, Zhang Liang. Test Data Compression Method for Multiple Scan Chain Based on Mirror-symmetrical Reference Slices[J]. Journal of Electronics & Information Technology, 2015, 37(6): 1513-1519. doi: 10.11999/JEIT141146

Citation:

Kuang Ji-shun, Liu Jie-tang, Zhang Liang. Test Data Compression Method for Multiple Scan Chain Based on Mirror-symmetrical Reference Slices[J]. Journal of Electronics & Information Technology, 2015, 37(6): 1513-1519. doi: 10.11999/JEIT141146

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Test Data Compression Method for Multiple Scan Chain Based on Mirror-symmetrical Reference Slices

doi: 10.11999/JEIT141146

Received Date: 2014-09-02
Rev Recd Date: 2014-12-23
Publish Date: 2015-06-19

Abstract

Abstract

In order to reduce test data and test time, a test data compression method for multiple scan chain which bases on mirror-symmetrical reference slices is proposed. This method uses two mutually mirror-symmetrical reference slices for compatibility comparison with scan slice, that improves the compression ratio. If the scan slice is compatible to one of the reference slices, only a few bits are needed to encode it and can be loaded in parallel. Otherwise, the scan slice will replace one reference slice. A longest compatibility strategy is proposed when the scan slice and reference slice satisfy more compatible relationship. It can further improve the test compression ratio to determine the code word according to the different compatibility frequency statistics situations. The experimental results show that the average compression rate of the proposed scheme reaches 69.13%.
- Test data compression,
- Multiple scan chain,
- Compatibility,
- Reference slice,
- Scan slice

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References(18)

References

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