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C. Erdi, IEEE J. of SC, SC-16(1981)6, 653-661.[2]C. D. Motchenbacher, F. C. Fitchen, Low-Noise Electronic Design, John Wiley and Sons, Inc. (1973),[3]Chapter 8-10.[4]方志豪,晶体管低噪声电路,科学出版社,北京,1984年,第三章.[5]A. Foord, Wireless world, 87(1981)4, 71-73. 9, 1068-1082.[6]S. Okwit, IEEE. Trans. on MTT, MITT-32(1984)9, 1068-2082.[7]W. Schottky, Ann. Physik, 57(1918)12, 541-567.[8]J. B. Johnson, Phys. Rev., 32(1923)7, 97-109.[9]J. B. Johnson, Bell. Lab. Rec., 3(1927)2, 185-187.[10]H. Nyqaist, Phys. Rev., 32(1928)7, 110-113.[11]J. A. Dobrowolskl, IEEE Trans. on MTT, MTT-37(1989)1, 15-20.[12]Von Dietmar Schroder, Frequenz, 39(1985)6, 170-174.[13]N. Laurence, SPICE-2: A Computer Program to Simulate Semiconductor Circuits, Memorandum No. ERL M520 College of Engineering University of California, Berkeley, (1975).[14]602 Electronic Circuit Analysis Program (ECAP), User's Manual, Application Program No. 1620-EE-02X, IBM, white plains, N. Y., 1970 ed.[15]Rohrer et al., IEEE J. of SC, SC-6(1971)4, 204-213.[16]罗涛,戴逸松,噪声电路理论及集成电路噪声计算,电子学报,18(1990)6, 79-76.[17]罗涛,戴逸松,电子线路噪声的割集谱分析法,科学通报,35(1990)1,28-31.[18]Loo Tao, Dai Yisong, Chinese Vrience Bulletin, 35(1990)13, 11.34-1135.[19]Aldert Van Der Ziel, Noise Sources, Charactterization, Measurement, Prentice-Hall, Inc., (1970), Chapter II.[20]罗涛,戴逸松,电子测最与仪器学报,3(1989)4,1-9.[21]罗涛,戴逸松,吉林工业大学学报,1982年,第4期,第52-58页.[22]H. T. Friis, Proc. IRE, 32(1944)7, 419-422.[23]A. V. Khevrolin, Tele. Rod. Eng., 37-38(1983)1-6, 73-76.[24]戴逸松,电子科学学刊,2(1980)4,158-168.[25]V, Rizzoli, A. Lipparini, IEEE Trans. on MTT, MTT-33(1985)12, 1507-1511.[26]U. L. Rohde, Microtoave J., 29(1986)10,154-160.[27]G. L. Vasilescu, Electron. Lett., 23(1987)7, 351-353.
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