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Volume 42 Issue 2
Feb.  2020
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Jiang ZHANG, Shuqin FAN. On the Hardness of the Asymmetric Learning With Errors Problem[J]. Journal of Electronics & Information Technology, 2020, 42(2): 327-332. doi: 10.11999/JEIT190685
Citation: Jiang ZHANG, Shuqin FAN. On the Hardness of the Asymmetric Learning With Errors Problem[J]. Journal of Electronics & Information Technology, 2020, 42(2): 327-332. doi: 10.11999/JEIT190685

On the Hardness of the Asymmetric Learning With Errors Problem

doi: 10.11999/JEIT190685
Funds:  The National Key Research and Development Program of China (2017YFB0802005, 2018YFB0804105), The National Natural Science Foundation of China (61602046, 61932019), The Young Elite Scientists Sponsorship Program by China Association for Science and Technology (2016QNRC001)
  • Received Date: 2019-09-14
  • Rev Recd Date: 2019-11-20
  • Available Online: 2019-11-29
  • Publish Date: 2020-02-19
  • Due to the advantages such as the worst-case hardness assumption, lattice-based cryptography is believed to the most promising research direction in post-quantum cryptography. As one of the two main hard problems commonly used in lattice-based cryptography, Learning With Errors (LWE) problem is widely used in constructing numerous cryptosystems. In order to improve the efficiency of lattice-based cryptosystems, Zhang et al. (2019) introduced the Asymmetric LWE (ALWE) problem. In this paper, the relation between the ALWE problem and the standard LWE problem is studied, and it shows that for certain error distributions the two problems are polynomially equivent, which paves the way for constructing secure lattice-based cryptosystems from the ALWE problem.
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